𝔖 Bobbio Scriptorium
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The b-Value Analysis for the Stability Investigation of the Ancient Athena Temple in Syracuse

✍ Scribed by A. Carpinteri; G. Lacidogna; A. Manuello


Book ID
111200962
Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
580 KB
Volume
47
Category
Article
ISSN
0039-2103

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The change of the depth profile and chemical bond character of Ge in Ge Y ion-implanted SiO 2 layers during annealing in an O 2 atmosphere has been studied by x-ray photoelectron spectroscopy (XPS). The Ge depth profiles in as-implanted and annealed samples as measured by XPS are in agreement with p