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The application of the point matching method to the analysis of microstrip lines with finite metallization thickness

✍ Scribed by Kosslowski, S.; Bogelsack, F.; Wolff, I.


Book ID
114552242
Publisher
IEEE
Year
1988
Tongue
English
Weight
554 KB
Volume
36
Category
Article
ISSN
0018-9480

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## Abstract A full‐wave analysis of the composite‐metal microstrip lines is presented. The effects of the composite metal to the loss of the microstrip lines are accurately investigated, which are often avoided by other methods. The metal layers of the microstrip lines are considered as lossy inhom