The application of the photographic method in β ray spectroscopy
✍ Scribed by W. Langendijk; L.S. Ornstein
- Publisher
- Elsevier Science
- Year
- 1940
- Weight
- 930 KB
- Volume
- 7
- Category
- Article
- ISSN
- 0031-8914
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
A review of the applications of total reflection x-ray photoelectron spectroscopy (TRXPS) to the semiconductor surface are described. When the grazing angle of incident x-rays is below the critical angle of x-ray total reflection, the penetration depth of the x-rays into the material is strongly att
The invariant embedding principle was applied to obtain closed analytical expressions of several magnitudes of interest in electron probe microanalysis [ ionization distribution function, /(qz) backscattering probability, etc. ] . This approach permits one easily to obtain solutions for a model whic