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The application of secondary ion mass spectrometry (SIMS) to the study of high temperature proton conductors (HTPC)

✍ Scribed by R.A De Souza; J.A Kilner; C Jeynes

Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 627 KB
Volume: 97
Category: Article
ISSN: 0167-2738
DOI: 10.1016/s0167-2738(97)00038-6

No coin nor oath required. For personal study only.

✦ Synopsis

The oxygen tracer diffusivity of CaZr In O , SrCe Yb O , and BaCe La O at a nominal oxygen 0.9 0.1 2.95 0.95 0.05 2.975 0.9 0.1 2.95 26 18 16 partial pressure of 1 atm (P |10 atm) has been measured in the temperature range 500-10008C by means of O / O H O 2 Isotope Exchange Depth Profiling (IEDP) with SIMS. The results are interpreted in terms of the ordering of oxygen vacancies in the orthorhombic structured perovskites. Negative secondary ion mass spectra (m /z516 to 19) obtained from SrCe Yb O samples are also discussed, with particular reference to the presence of fluorine. Confirmation of 0.95 0.05 2.975 19

fluorine contamination was provided by F Proton Induced Gamma-ray Emission (PIGE) analysis.

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