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The application of charge-pumping technique to characterize the SiSiO2 interface in power VDMOSFETs

✍ Scribed by P. Habaš; Z. Prijić; D. Pantić


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
414 KB
Volume
28
Category
Article
ISSN
0167-9317

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