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The accelerated testing of plastic encapsulated semiconductor components : R. W. Lawson. Proc. IEEE Reliab. Phys. Symp. 243 (1974)

Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 134 KB
Volume: 14
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(75)90513-2

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