✦ LIBER ✦
Influence of electrical bias level on 85/85 test results of plastic encapsulated 4K RAMS : John W. Peeples. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 154
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 249 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0026-2714
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