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Texture analysis of a recrystallized quartzite using electron diffraction in the scanning electron microscope

✍ Scribed by F. Heidelbach; K. Kunze; H.-R. Wenk


Book ID
114180922
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
479 KB
Volume
22
Category
Article
ISSN
0191-8141

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A new coaxial detection system for backscattered electrons in SEM is described. This coaxial detection system allows us to collect only the backscattered electrons that have lost a small percentage of the primary energy, emerging from the sample surface with a take-off angle defined by the objective