Testing iterative logic arrays for sequential faults with a constant number of patterns

✍ Scribed by Chih-Yuang Su; Cheng-Wen Wu

• Book ID: 119772189
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 712 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9340
• DOI: 10.1109/12.278489