๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Testing from a nondeterministic finite state machine using adaptive state counting

โœ Scribed by Hierons, R.M.


Book ID
118697811
Publisher
IEEE
Year
2004
Tongue
English
Weight
780 KB
Volume
53
Category
Article
ISSN
0018-9340

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


A test methodology for finite state mach
โœ Hyoung B. Min; William A. Rogers ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Springer US ๐ŸŒ English โš– 876 KB

This paper presents an efficient automatic test pattern generation technique for loop-free circuits. A partial scan technique is used to convert a sequential circuit (finite state machine) with arbitrary feedback paths into a pipelined circuit for testing. Test generation for these modified circuits