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Testing a Hierarchical Model of Distress Tolerance

✍ Scribed by Joseph R. Bardeen, Thomas A. Fergus…

Book ID
120686631
Publisher
Springer US
Year
2013
Tongue
English
Weight
240 KB
Volume
35
Category
Article
ISSN
1573-3505

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✍ Claude Thibeault; Yvon Savaria; Jean -Louis Houle 📂 Article 📅 1992 🏛 Springer US 🌐 English ⚖ 783 KB

This paper presents a theoretical expression to evaluate the test quality of hierarchical defect-tolerant integrated circuits. This expression, which is developed for circuits with two levels of hierarchy, is based on a defect model with which one can take into account the relative importance (proba