Testing a 32-channel integrated circuit for recording signals of silicon detectors

✍ Scribed by Atkin, E. V.; Volkov, Yu. A.; Voronin, A. G.; Dement’ev, D. V.; Il’yushchenko, I. I.; Karmanov, D. E.; Klyuev, A. D.; Kudryashov, I. A.; Lobanov, A. A.; Podorozhnyi, D. M.; Shumikhin, V. V.

• Book ID: 125455099
• Publisher: Springer
• Year: 2012
• Tongue: English
• Weight: 277 KB
• Volume: 55
• Category: Article
• ISSN: 0020-4412
• DOI: 10.1134/s0020441212030098