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[IEEE 2011 IEEE Asian Solid-State Circuits Conference (A-SSCC) - Jeju, South Korea (2011.11.14-2011.11.16)] IEEE Asian Solid-State Circuits Conference 2011 - A 900 Mbps single-channel capacitive I/O link for wireless wafer-level testing of integrated circuits

✍ Scribed by Lee, Dae Young; Wentzloff, David D.; Hayes, John P.

Book ID: 121215995
Publisher: IEEE
Year: 2011
Weight: 485 KB
Category: Article
ISBN: 1457717832
DOI: 10.1109/ASSCC.2011.6123625

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