Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors

✍ Scribed by C. Thibeault; Y. Hariri; C. Hobeika

• Book ID: 113068541
• Publisher: Springer US
• Year: 2011
• Tongue: English
• Weight: 323 KB
• Volume: 28
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-011-5271-2