Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST

✍ Scribed by Boubezari, S.; Cerny, E.; Kaminska, B.; Nadeau-Dostie, B.

• Book ID: 119778522
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 291 KB
• Volume: 18
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.784124