Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision Problems

✍ Scribed by Desta Tadesse; R. Iris Bahar; Joel Grodstein

• Book ID: 106384527
• Publisher: Springer US
• Year: 2011
• Tongue: English
• Weight: 442 KB
• Volume: 27
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-011-5205-z