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Test structure to determine tip sharpness of micromechanical probes of scanning force microscopy

✍ Scribed by A. N. Belov; S. A. Gavrilov; I. V. Sagunova; A. A. Tikhomirov; Yu. A. Chaplygin; V. I. Shevyakov

Book ID
111473134
Publisher
SP MAIK Nauka/Interperiodica
Year
2010
Tongue
English
Weight
718 KB
Volume
5
Category
Article
ISSN
1995-0780

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While image quality from instruments such as electron microscopes, light microscopes, and confocal laser scanning microscopes is mostly influenced by the alignment of optical train components, the atomic force microscope differs in that image quality is highly dependent upon a consumable component,