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Reduction of Tip−Sample Contact Using Dielectrophoretic Force Scanning Probe Microscopy

✍ Scribed by Hilton, Al M.; Lynch, Brian P.; Simpson, Garth J.

Book ID: 126144535
Publisher: American Chemical Society
Year: 2005
Tongue: English
Weight: 262 KB
Volume: 77
Category: Article
ISSN: 0003-2700
DOI: 10.1021/ac051384k

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