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Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes

✍ Scribed by Liang, Feng; Zhang, Luwen; Lei, Shaochong; Zhang, Guohe; Gao, Kaile; Liang, Bin

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A Class of SIC Circuits: Theory and Appl

✍ Lei Shaochong, ;Hou Xueyan, ;Shao Zhibiao, ;Liang Feng, 📂 Article 📅 2008 🏛 Institute of Electrical and Electronics Engineers 🌐 English ⚖ 314 KB

[IEEE International Test Conference, 200

✍ Wohl, P.; Waicukauski, J.A.; Patel, S.; Amin, M.B. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 944 KB