✦ LIBER ✦

Test Path Selection for Capturing Delay Failures Under Statistical Timing Model

✍ Scribed by He, Zijian; Lv, Tao; Li, Huawei; Li, Xiaowei

Book ID: 120552535
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 433 KB
Volume: 21
Category: Article
ISSN: 1063-8210
DOI: 10.1109/TVLSI.2012.2208661

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Critical path selection for delay fault

Critical path selection for delay fault testing based upon a statistical timing model

✍ Wang, L.-C.; Jing-Jia Liou; Kwang-Ting Cheng 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 706 KB

Longest-path selection for delay test un

Longest-path selection for delay test under process variation

✍ Xiang Lu; Zhuo Li; Wangqi Qiu; Walker, D.M.H.; Weiping Shi 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 267 KB

A MODEL SELECTION TEST FOR BIVARIATE FAI

A MODEL SELECTION TEST FOR BIVARIATE FAILURE-TIME DATA

✍ Chen, Xiaohong; Fan, Yanqin 📂 Article 📅 2007 🏛 Cambridge University Press 🌐 English ⚖ 207 KB

[ACM Press the 39th conference - New Orl

[ACM Press the 39th conference - New Orleans, Louisiana, USA (2002.06.10-2002.06.14)] Proceedings of the 39th conference on Design automation - DAC '02 - False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation

✍ Liou, Jing-Jia; Krstic, Angela; Wang, Li-C.; Cheng, Kwang-Ting 📂 Article 📅 2002 🏛 ACM Press 🌐 English ⚖ 76 KB

Sponsored By Acm ... [et Al.]. Cover Title. Acm Order Number 477020 ; Ieee Catalog Number 02ch37324--t.p. Verso. Includes Bibliographical References And Author Index. Also Available On The World Wide Web Via Acm Digital Library With Title: Proceedings Of The 39th Conference On Design Automation, 200

[ACM Press the 2003 conference - Kitakyu

[ACM Press the 2003 conference - Kitakyushu, Japan (2003.01.21-2003.01.24)] Proceedings of the 2003 conference on Asia South Pacific design automation - ASPDAC - Experience in critical path selection for deep sub-micron delay test and timing validation

✍ Liou, Jing-Jia; Wang, Li-C.; Krstic, Angela; Cheng, Kwang-Ting 📂 Article 📅 2003 🏛 ACM Press ⚖ 105 KB

[IEEE 2001 IEEE International Reliabilit

[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - High-performance chip reliability from short-time-tests-statistical models for optical interconnect and HCI/TDDB/NBTI deep-submicron transistor failures

✍ Haggag, A.; McMahon, W.; Hess, K.; Cheng, K.; Lee, J.; Lyding, J. 📂 Article 📅 2001 🏛 IEEE ⚖ 1010 KB