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Test of a MAPS realized in standard non-epitaxial CMOS technology

✍ Scribed by L. Servoli; G.M. Bilei; D. Passeri; P. Placidi; D. Biagetti; T. Bianchi; P. Ciampolini; A. Marras; A. Delfanti

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 353 KB
Volume: 581
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2007.07.139

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