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Test efficiency analysis of random self-test of sequential circuits

✍ Scribed by Sastry, S.; Majumdar, A.

Book ID: 119778281
Publisher: IEEE
Year: 1991
Tongue: English
Weight: 766 KB
Volume: 10
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.67792

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