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Test Data Compression Using Efficient Bitmask and Dictionary Selection Methods

✍ Scribed by Basu, K.; Mishra, P.

Book ID: 118161860
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 742 KB
Volume: 18
Category: Article
ISSN: 1063-8210
DOI: 10.1109/tvlsi.2009.2024116

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