Test Cycle Count Reduction in a Parallel Scan BIST Environment

✍ Scribed by Bechir Ayari; Prab Varma

• Book ID: 110261594
• Publisher: Springer US
• Year: 2000
• Tongue: English
• Weight: 542 KB
• Volume: 16
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1023/a:1008304329142