𝔖 Bobbio Scriptorium
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Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment

✍ Scribed by Chunsheng Liu; Chakrabarty, K.


Book ID
118698373
Publisher
IEEE
Year
2003
Tongue
English
Weight
685 KB
Volume
22
Category
Article
ISSN
0278-0070

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