Test beam results of heavily irradiated magnetic Czochralski silicon (MCz-Si) strip detectors
✍ Scribed by P. Luukka; J. Härkünen; T. Mäenpää; B. Betchart; S. Bhattacharya; S. Czellar; R. Demina; A. Dierlamm; Y. Gotra; M. Frey; F. Hartmann; V. Karimäki; T. Keutgen; S. Korjenevski; M.J. Kortelainen; T. Lampén; V. Lemaitre; M. Maksimow; O. Militaru; H. Moilanen; M. Neuland; H.J. Simonis; L. Spiegel; E. Tuominen; J. Tuominiemi; E. Tuovinen; H. Viljanen
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 434 KB
- Volume
- 612
- Category
- Article
- ISSN
- 0168-9002
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We have processed full-size strip detectors on Czochralski grown silicon wafers with resistivity of about 1.2 kO cm. Wafers grown with Czochralski method intrinsically contain high concentrations of oxygen, and thus have potential for high radiation tolerance. Detectors and test diodes were irradiat