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Test and Measurement of Analog and RF Cores in Mixed-Signal SoC Environment

✍ Scribed by Rashidzadeh, R.; Ahmadi, M.; Miller, W.C.

Book ID: 117907904
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 804 KB
Volume: 26
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2007.895791

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