## Abstract By using backward‐wave oscillator system, the terahertz dielectric properties of p‐type silicon were tested in the frequency range extending from 0.68 to 0.85 THz. The refractive indices, the power absorption coefficient, and the dielectric functions of various resistivity p‐type silico
Terahertz wave omnidirectional dielectric mirror
✍ Scribed by Jiu-Sheng Li
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 660 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0030-3992
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✦ Synopsis
We design an omnidirectional dielectric mirror that operates over a wide terahertz wavelength range and is based on a periodic bilayer (tellurium and polystyrene) structure. The structure is characterized by using transfer matrix calculation. Results of simulation show that the presented dielectric mirror is highly reflecting for all incidence angles and TE as well as TM polarization in the frequency band from 0.451 to 0.821 THz (i.e. wavelength ranges from 365.5 to 665.5 mm), when the incidence angle is less than 451. Tolerance analysis reveals a large tolerance to fabrication errors.
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