𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Temperature-induced valence change of YbAl2 studied by XPS and BIS

✍ Scribed by S.-J. Oh; J.W. Allen; M.S. Torikachvili; M.B. Maple


Book ID
113312606
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
282 KB
Volume
52
Category
Article
ISSN
0304-8853

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


The Nitridation of a Silicon Powder Stud
✍ Sen Wang, Pu; Wittberg, Thomas N. πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 352 KB πŸ‘ 2 views

XPS and x-ray-induced AES have been used to study the reaction layers formed on silicon powder samples heated in ultra-high purity nitrogen at temperatures between 1100 and 1200 "C. An equation was derived to calculate the average surface reaction layer thicknesses from the silicon AES spectra. The

Core-level and valence-band electronic s
✍ Y. Fukuda; K. Terashima; Y. Nakanishi; T. Suzuki; M. Nagoshi; Y. Syono; M. Tachi πŸ“‚ Article πŸ“… 1989 πŸ› Elsevier Science 🌐 English βš– 116 KB

Core-level and valence-band electronic structures of Bi2Sr2Cal-xYxCu2Oy (x=0,O.4, and 0.7) have been studied by X-ray and UV photoemlsslon spectroscopy. A Fermi edge is observed for x=0.4 as well as for x=0. It is found that the density of states at the Fermi level and the intensity of a 1.2-eV peak