Temperature-dependent microwave noise performances of AlGaN/GaN HEMTs with post-gate annealing

✍ Scribed by Dongmin Liu; Jaesun Lee; Wu Lu

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 100 KB
• Volume: 2
• Category: Article
• ISSN: 1862-6351
• DOI: 10.1002/pssc.200461510