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Temperature-dependent leakage mechanisms of PtâBiFeO[sub 3]âSrRuO[sub 3] thin film capacitors

✍ Scribed by Yang, H.; Jain, M.; Suvorova, N. A.; Zhou, H.; Luo, H. M.; Feldmann, D. M.; Dowden, P. C.; DePaula, R. F.; Foltyn, S. R.; Jia, Q. X.

Book ID: 120384288
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 622 KB
Volume: 91
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2772666

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