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Leakage mechanisms in BiFeO[sub 3] thin films

✍ Scribed by Pabst, Gary W.; Martin, Lane W.; Chu, Ying-Hao; Ramesh, R.

Book ID: 120166610
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 679 KB
Volume: 90
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2535663

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