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Temperature dependent electron-hole recombination in polymer light-emitting diodes

✍ Scribed by Blom, P. W. M.; de Jong, M. J. M.; Breedijk, S.


Book ID
120199987
Publisher
American Institute of Physics
Year
1997
Tongue
English
Weight
308 KB
Volume
71
Category
Article
ISSN
0003-6951

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## Abstract It has recently been reported that, after electrical conditioning, an ohmic hole contact is formed in poly(9,9‐dioctylfluorene) (PFO)‐based polymer light‐emitting diodes (PLED), despite the large hole‐injection barrier obtained with a poly(styrene sulfonic acid)‐doped poly(3,4‐ethylened