Temperature-dependent current–voltage characteristics of Er-silicide Schottky contacts to strained Si-on-insulator

✍ Scribed by Jyothi, I.; Seo, Min-Woo; Janardhanam, V.; Shim, Kyu-Hwan; Lee, Young-Boo; Ahn, Kwang-Soon; Choi, Chel-Jong

• Book ID: 121984128
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 994 KB
• Volume: 556
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/j.jallcom.2012.12.143