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Temperature dependent compact modeling of gate tunneling leakage current in double gate MOSFETs

✍ Scribed by Darbandy, Ghader; Aghassi, Jasmin; Sedlmeir, Josef; Monga, Udit; Garduño, Ivan; Cerdeira, Antonio; Iñiguez, Benjamin


Book ID
120324507
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
547 KB
Volume
81
Category
Article
ISSN
0038-1101

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