𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Temperature dependence of the X-ray diffuse scattering intensity in V3Si in the temperature range from 8 to 300 K

✍ Scribed by Acad.; Prof. N. N. Sirota; L. P. Polutchankina; N. S. Orlova


Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
410 KB
Volume
18
Category
Article
ISSN
0232-1300

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


On temperature dependence of Debye-Walle
✍ Acad.; Prof. N. N. Sirota; L. P. Polutchankina πŸ“‚ Article πŸ“… 1981 πŸ› John Wiley and Sons 🌐 English βš– 284 KB πŸ‘ 1 views

## Abstract The temperature dependence of the Debye‐Waller factors of vanadium and silicon in V~3~Si and that of the X‐ray Debye temperature are obtained from the integral intensities of X‐ray reflection measured at 11 temperatures ranging from 8 K to 293 K. It shown that the breaks on these curves

A Range of Spin-Crossover Temperature T1