Temperature dependence of the Hall coefficient of thin films : C. R. Tellier, C. Pichard and A. J. Tosser. Electrocomp. Sci. Technol.6, 19 (1979)

• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 137 KB
• Volume: 20
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(80)90354-6