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Temperature dependence of Raman scattering from 4H-SiC with hexagonal defects

✍ Scribed by Han, R.; Han, B.; Wang, D. H.; Li, C.


Book ID
121826435
Publisher
American Institute of Physics
Year
2011
Tongue
English
Weight
485 KB
Volume
99
Category
Article
ISSN
0003-6951

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