Temperature dependence of penetration depth in thin film niobium
β Scribed by More, N.; Muhlfelder, B.; Lockhart, J.
- Book ID
- 114550094
- Publisher
- IEEE
- Year
- 1989
- Tongue
- English
- Weight
- 374 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0018-9464
- DOI
- 10.1109/20.92728
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π SIMILAR VOLUMES
A novel technique for measuring the temperature dependence of the penetration depth 2 (T) for HTSC films has been demonstrated using the resonance frequency of the LC circuit with a one-pancake spiral coil. The 2(T) dependence is in agreement with two-coil mutual inductance method data and with BCS
By using Green's function method the temperature dependence of the optical conductivity and penetration depth of high-quality MgB 2 film are calculated in the framework of the two-band model. We compare our results with experimental data and we argue that the single gap model is insufficient to desc