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Temperature dependence of electrical conduction in amorphous Se layers

✍ Scribed by C. Vautier; D. Carles; C. Viger


Book ID
118919471
Publisher
Elsevier Science
Year
1972
Tongue
English
Weight
233 KB
Volume
7
Category
Article
ISSN
0022-3093

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The analysis of X-ray diffraction patterns for Sb Se system, indicates the amorphous structure of thin film samples. Thin film samples of Sb Se were prepared by thermal evaporation. The current-voltage characteristics in the temperature range 297-353 K and thickness range 440-937.8 nm are ohmic in t