Temperature and light soaking dependence
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M. Fadel; N.A. Hegab; E. Abd El-Wahabb
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Article
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1999
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Elsevier Science
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English
⚖ 172 KB
The analysis of X-ray diffraction patterns for Sb Se system, indicates the amorphous structure of thin film samples. Thin film samples of Sb Se were prepared by thermal evaporation. The current-voltage characteristics in the temperature range 297-353 K and thickness range 440-937.8 nm are ohmic in t