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Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies

✍ Scribed by Gadlage, Matthew J.; Ahlbin, Jonathan R.; Ramachandran, Vishwanath; Gouker, Pascale; Dinkins, Cody A.; Bhuva, Bharat L.; Narasimham, Balaji; Schrimpf, Ronald D.; McCurdy, Michael W.; Alles, Michael L.; Reed, Robert A.; Mendenhall, Marcus H.; Massengill, Lloyd W.; Shuler, Robert L.; McMorrow, Dale

Book ID: 120266189
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 751 KB
Volume: 56
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2009.2034150

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