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Temperature dependance of thin film transistor characteristics

✍ Scribed by T.O. Poehler; David Abraham

Publisher: Elsevier Science
Year: 1964
Tongue: English
Weight: 206 KB
Volume: 7
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(64)90073-5

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