Temperature behaviour and annealing of insulated gate transistors subjected to localized lifetime control by proton implantation : A. Mogro-Campero, R. P. Love, M. F. Chang and R. F. Dyer. Solid-St. Electron.30 (2), 185 (1987)

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 260 KB
• Volume: 27
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(87)90352-0