Temperature behavior and annealing of insulated gate transistors subjected to localized lifetime control by proton implantation

✍ Scribed by A. Mogro-Campero; R.P. Love; M.F. Chang; R.F. Dyer

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 415 KB
• Volume: 30
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(87)90147-x