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Temperature behavior and modeling of ohmic contacts to Si+ implanted n-type GaN

✍ Scribed by A. Pérez-Tomás; M. Placidi; A. Fontserè; P.M. Gammon; M.R. Jennings

Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 677 KB
Volume: 51
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2011.03.023

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