Temperature and field dependences of the generation-recombination noise and the thermal emission rates at the gold acceptor center in silicon

✍ Scribed by L.D. Yau; C.T. Sah

• Publisher: Elsevier Science
• Year: 1970
• Tongue: English
• Weight: 564 KB
• Volume: 13
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(70)90017-1