Temperature and field dependences of the generation-recombination noise and the thermal emission rates at the gold acceptor center in silicon : L. D. Yau and C. T. Sah, Solid-St. Electron.13 (1970), p. 1213

• Publisher: Elsevier Science
• Year: 1971
• Tongue: English
• Weight: 112 KB
• Volume: 10
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(71)90743-8