Temperature and field dependence on the photoconductive decay measurements of RF sputtered and CVD grown a-Si

✍ Scribed by Lue, Juh Tzeng

• Publisher: John Wiley and Sons
• Year: 1985
• Tongue: English
• Weight: 220 KB
• Volume: 92
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210920257