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Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure

✍ Scribed by Nowozin, T.; Marent, A.; Geller, M.; Bimberg, D.; AkcÌ§ay, N.; OÌncan, N.

Book ID: 120416153
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 376 KB
Volume: 94
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.3076126

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